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Defect recognition and image processing in semiconductors 1995 : proceedings of the sixth International Conference, held in Boulder, Colorado, 3-6 December 1995
フォーマット:
図書
責任表示:
edited by A.R. Mickelson
言語:
英語
出版情報:
Bristol ; Philadelphia : Institute of Physics Pub., c1996
形態:
xii, 369 p.
著者名:
シリーズ名:
Institute of Physics conference series ; no. 149 <BA00171324>
書誌ID:
BA27981245
ISBN:
9780750303729 [0750303727]  CiNii Books  Webcat Plus  Google Books
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