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1.

図書

図書
edited by Judy Illes and Barbara J. Sahakian ; assistant editors, Carole A. Federico and Sharon Morein-Zamir
出版情報: New York : Oxford University Press, 2011
2.

図書

図書
Robert S. Doran, Paul J. Sally, Jr., Loren Spice, editors
出版情報: Providence, R.I. : American Mathematical Society, c2011
シリーズ名: Contemporary mathematics ; 543
3.

図書

図書
Carina Boyallian, Esther Galina, Linda Saal, editors
出版情報: Providence, R.I. : American Mathematical Society, c2011
シリーズ名: Contemporary mathematics ; 544
4.

図書

図書
出版情報: 東京 : 技術評論社, 2011-
5.

図書

図書
Iasson Karafyllis, Zhong-Ping Jiang ; foreword by E. Sontag
出版情報: London : Springer, c2011
シリーズ名: Communications and control engineering
6.

図書

図書
James E. Crimmins
出版情報: London : Continuum, c2011
シリーズ名: Continuum studies in British philosophy
7.

図書

図書
Gijs Beets, Joop Schippers, Egbert R. te Velde, editors
出版情報: Dordrecht : Springer, c2011
8.

図書

図書
日経BP社
出版情報: [東京] : 日経BP社 , 東京 : 日経BPマーケティング (発売), 2011-
9.

図書

図書
edited by Krzysztof Iniewski
出版情報: Boca Raton : CRC Press, c2011
シリーズ名: Devices, circuits, and systems
目次情報: 続きを見る
Radiation damage in silicon Gianluigi Casse
Radiation-tolerant CMOS single-photon imagers for multiradiation detection Edoardo Charbon ... [et al.]
Effects of hydrogen on the radiation response on field-oxide field-effect transistors and high-k dielectrics Xing J. Zhou, Daniel M. Fleetwood, and Ronald D. Schrimpf
Novel total dose and heavy-ion charge collection phenomena in a new SiGe HBT on thin-film SOI technology Grégory Avenier ... [et al.]
Radiation-hard voltage and current references in standard CMOS technologies Vladimir Gromov and Anne-Johan Annema
Nanocrystal memories : an evolutionary approach to flash memory scaling and a class of radiation-tolerant devices Cosimo Gerardi ... [et al.]
Radiation hardened by design SRAM strategies for TID and SEE mitigation Lawrence T. Clark
A complete guide to multiple upsets in SRAMs processed in decananometric CMOS technologies Gilles Gasiot and Phillippe Roche
Real-time soft error rate characterization of advanced SRAMs Jean-Luc Autran ... [et al.]
Fault tolerance techniques and reliability modeling for SRAM-based FPGAs Keith S. Morgan ... [et al.]
Assuring robust triple modular redundancy protected circuits in SRAM-based FPGAs Michael Caffrey ... [et al.]
SEU/SET tolerant phase-locked loops Robert L. Shuler, Jr.
Autonomous detection and characterization of radiation-induced transients in semiconductor integrated circuits Balaji Narasimham ... [et al.]
Soft errors in digital circuits : overview and protection techniques for digital filters Pedro reviriego Vasallo and Juan Antonio Maestro
Fault-injection techniques for dependability analysis : an overview Massimo Violante
Radiation damage in silicon Gianluigi Casse
Radiation-tolerant CMOS single-photon imagers for multiradiation detection Edoardo Charbon ... [et al.]
Effects of hydrogen on the radiation response on field-oxide field-effect transistors and high-k dielectrics Xing J. Zhou, Daniel M. Fleetwood, and Ronald D. Schrimpf
10.

図書

図書
Umberto Eco ; traduit de l'italien par Jean-Noël Schifano
出版情報: Paris : Bernard Grasset, c2011