静岡大学附属図書館 OPAC/myLibrary

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	Radiation damage in silicon	Gianluigi Casse
	Radiation-tolerant CMOS single-photon imagers for multiradiation detection	Edoardo Charbon ... [et al.]
	Effects of hydrogen on the radiation response on field-oxide field-effect transistors and high-k dielectrics	Xing J. Zhou, Daniel M. Fleetwood, and Ronald D. Schrimpf
	Novel total dose and heavy-ion charge collection phenomena in a new SiGe HBT on thin-film SOI technology	Grégory Avenier ... [et al.]
	Radiation-hard voltage and current references in standard CMOS technologies	Vladimir Gromov and Anne-Johan Annema
	Nanocrystal memories : an evolutionary approach to flash memory scaling and a class of radiation-tolerant devices	Cosimo Gerardi ... [et al.]
	Radiation hardened by design SRAM strategies for TID and SEE mitigation	Lawrence T. Clark
	A complete guide to multiple upsets in SRAMs processed in decananometric CMOS technologies	Gilles Gasiot and Phillippe Roche
	Real-time soft error rate characterization of advanced SRAMs	Jean-Luc Autran ... [et al.]
	Fault tolerance techniques and reliability modeling for SRAM-based FPGAs	Keith S. Morgan ... [et al.]
	Assuring robust triple modular redundancy protected circuits in SRAM-based FPGAs	Michael Caffrey ... [et al.]
	SEU/SET tolerant phase-locked loops	Robert L. Shuler, Jr.
	Autonomous detection and characterization of radiation-induced transients in semiconductor integrated circuits	Balaji Narasimham ... [et al.]
	Soft errors in digital circuits : overview and protection techniques for digital filters	Pedro reviriego Vasallo and Juan Antonio Maestro
	Fault-injection techniques for dependability analysis : an overview	Massimo Violante

	Radiation damage in silicon	Gianluigi Casse
	Radiation-tolerant CMOS single-photon imagers for multiradiation detection	Edoardo Charbon ... [et al.]
	Effects of hydrogen on the radiation response on field-oxide field-effect transistors and high-k dielectrics	Xing J. Zhou, Daniel M. Fleetwood, and Ronald D. Schrimpf

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